X-ray Diffraction (XRD) Analysis
| Parameter | Specification |
|---|---|
| Technique | X-ray Diffraction (XRD) |
| Measurement Mode | Powder XRD, Thin-Film XRD |
| X-ray Source | Cu Kα (typical) |
| Scan Range (2θ) | ~5° – 90° (configurable) |
| Phase Identification | Yes (database-assisted) |
| Crystallite Size | Yes (Scherrer analysis) |
| Lattice Parameters | Yes |
| Texture / Orientation | Optional (GIXRD, pole figures) |
| Stress / Strain | Optional |
| Sample Type | Powders, bulk solids, thin films, coatings |
| Sample Preparation | Powder mounting, flat-surface mounting |
| Information Obtained | Phase composition, crystallinity, structural parameters |
| Typical Use Cases | Ceramics, oxides, semiconductors, functional materials |
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Warranty. The Consumer Protection Act does not provide for the return of this product of proper quality.
Description
Advanced X-ray Diffraction service for phase identification, crystallographic analysis, and structural characterization of materials. XRD enables reliable determination of crystal structure, phase composition, and crystallite parameters essential for correlating processing, structure, and performance.
Key Applications
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Phase identification and phase purity analysis
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Crystal structure and lattice parameter determination
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Thin-film and coating structural evaluation
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Stress, texture, and preferred orientation studies
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Quality control and material validation
Specifications
| Parameter | Specification |
|---|---|
| Technique | X-ray Diffraction (XRD) |
| Measurement Mode | Powder XRD, Thin-Film XRD |
| X-ray Source | Cu Kα (typical) |
| Scan Range (2θ) | ~5° – 90° (configurable) |
| Phase Identification | Yes (database-assisted) |
| Crystallite Size | Yes (Scherrer analysis) |
| Lattice Parameters | Yes |
| Texture / Orientation | Optional (GIXRD, pole figures) |
| Stress / Strain | Optional |
| Sample Type | Powders, bulk solids, thin films, coatings |
| Sample Preparation | Powder mounting, flat-surface mounting |
| Information Obtained | Phase composition, crystallinity, structural parameters |
| Typical Use Cases | Ceramics, oxides, semiconductors, functional materials |
Sample Preparation Support
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Powder grinding and homogenization guidance
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Thin-film and coating mounting support
-
Grazing-incidence configurations for low-thickness films
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Alignment optimization for accurate peak analysis
-
(Proper sample preparation ensures reliable diffraction data and phase interpretation.)
Deliverables
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Diffraction patterns (intensity vs 2θ)
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Phase identification reports
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Lattice parameter and crystallite size analysis
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Texture or stress results (if requested)
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Expert interpretation linked to material behavior
Who Should Use This Service
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Materials development and quality-control teams
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Ceramic, oxide, and semiconductor researchers
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Thin-film and coating developers
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Failure analysis and process validation groups
Important Note
XRD primarily probes crystalline structure.
Amorphous content, nanoscale disorder, and interface chemistry often require complementary techniques such as TEM, XPS, or APT for complete understanding.
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